Jain, V., Biesinger, M. C., & Linford, M. R. (2018). The Gaussian-Lorentzian Sum, Product, and Convolution (Voigt) functions in the context of peak fitting X-ray photoelectron spectroscopy (XPS) narrow scans. Applied Surface Science , 447 , 548-553. Spectral peaks are generally assumed to be Gaussian function. The width of its half maximum defines spectral resolution of the sensor. When interpolating spectral signal, linear one is risky especially near the peak wavelength.
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